2800 search results - page 368 / 560 » Scaling RDF with time |
163
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
As wireless LAN devices become more prevalent in the consumer electronics market, there is an ever increasing pressure to reduce their overall cost. The test cost of such devices ...
159
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a significant reliability concern in present day digital circuit design. With continued scaling, th...
150
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ICCAD
2005
IEEE
16 years 3 months ago
2005
IEEE
Clustering (or partitioning) is a crucial step between logic synthesis and physical design in the layout of a large scale design. A design verified at the logic synthesis level m...
148
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ICCAD
2005
IEEE
16 years 3 months ago
2005
IEEE
Placement migration is a critical step to address a variety of postplacement design closure issues, such as timing, routing congestion, signal integrity, and heat distribution. To...
162
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ICCAD
2004
IEEE
16 years 3 months ago
2004
IEEE
While process variations are becoming more significant with each new IC technology generation, they are often modeled via linear regression models so that the resulting performanc...