2800 search results - page 313 / 560 » Scaling RDF with time |
156
Voted
DAC
2006
ACM
16 years 7 months ago
2006
ACM
Aggressive scaling of technology has an adverse impact on the reliability of VLSI circuits. Apart from increasing transient error susceptibility, the circuits also become more vul...
163
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MICCAI
2003
Springer
16 years 7 months ago
2003
Springer
A robust and automatic system has been developed to detect the visual axis and extract important feature landmarks from slit-lamp photographs, and objectively grade the severity of...
176
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WWW
2007
ACM
16 years 7 months ago
2007
ACM
The aggregation and comparison of behavioral patterns on the WWW represent a tremendous opportunity for understanding past behaviors and predicting future behaviors. In this paper...
171
Voted
VLSID
2007
IEEE
16 years 7 months ago
2007
IEEE
Device scaling such as reduced oxide thickness and high electric field has given rise to various reliability concerns. One such growing issue of concern is the degradation of PMOS...
166
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ICSE
2005
IEEE-ACM
16 years 6 months ago
2005
IEEE-ACM
COCONUT calibrates effort estimation models using an exhaustive search over the space of calibration parameters in a COCOMO I model. This technique is much simpler than other effo...