2800 search results - page 271 / 560 » Scaling RDF with time |
153
click to vote
ICCD
2004
IEEE
16 years 3 months ago
2004
IEEE
— In this paper, we approach the gate sizing problem in VLSI circuits in the context of increasing variability of process and circuit parameters as technology scales into the nan...
204
click to vote
ICCD
2004
IEEE
16 years 3 months ago
2004
IEEE
Research in high-speed interconnect requires physical test to validate circuit models and design assumptions. At multi-Gbit/sec rates, physical implementations require custom circ...
141
click to vote
ICCAD
2004
IEEE
16 years 3 months ago
2004
IEEE
Kth increasing uncertainties in the modeling and pmcessing of semiconductor devices, it is essential that the sources of failures be identified once the devices ure manufactured I...
175
click to vote
CVPR
2010
IEEE
16 years 3 months ago
2010
IEEE
Many computer vision problems rely on computing histogram-based objective functions with a sliding window. A main limiting factor is the high computational cost. Existing computat...
217
click to vote
CVPR
2010
IEEE
16 years 3 months ago
2010
IEEE
We introduce a novel data-driven mean-shift belief propagation
(DDMSBP) method for non-Gaussian MRFs, which
often arise in computer vision applications. With the aid
of scale sp...