During mass casualty incidents, an enormous amount of data, including the vital signs of the patients, the location of the patients, and the location of the first responders must ...
Tia Gao, Tammara Massey, Majid Sarrafzadeh, Leo Se...
In this paper we describe how Network-on-Chip (NoC) will be the next major challenge to implementing complex and function-rich applications in advanced manufacturing processes at ...
Continued advancements in fabrication technology and reductions in feature size create challenges in maintaining both manufacturing yield rates and long-term reliability of device...
Premkishore Shivakumar, Stephen W. Keckler, Charle...
— The need to perform power analysis in the early stages of the design process has become critical as power has become a major design constraint. Embedded and highperformance mic...
Technology mapping based on DAG-covering suffers from the problem of structural bias: the structure of the mapped netlist depends strongly on the subject graph. In this paper we ...
Satrajit Chatterjee, Alan Mishchenko, Robert K. Br...