2917 search results - page 296 / 584 » Satisfying Interaction Constraints |
184
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VTS
2000
IEEE
15 years 11 months ago
2000
IEEE
Excessive switching activity during scan testing can cause average power dissipation and peak power during test to be much higher than during normal operation. This can cause prob...
191
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SOFSEM
1999
Springer
15 years 11 months ago
1999
Springer
We study learning scenarios in which multiple learners are involved and “nature” imposes some constraints that force the predictions of these learners to behave coherently. Thi...
189
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KBSE
1997
IEEE
15 years 11 months ago
1997
IEEE
In software testing, it is often desirable to find test inputs that exercise specific program features. To find these inputs by hand is extremely time-consuming, especially whe...
151
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ICTAI
1993
IEEE
15 years 10 months ago
1993
IEEE
Unit commitment is a complex decision-making process because of multiple constraints which must not be violated while nding the optimal or a near-optimal commitment schedule. This...
197
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ITC
1994
IEEE
15 years 10 months ago
1994
IEEE
Previous approaches to designing random pattern testable circuits use post-synthesis test point insertion to eliminate random pattern resistant (r.p.r.) faults. The approach taken...