11488 search results - page 162 / 2298 » Robust optimization - methodology and applications |
136
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MR
2006
15 years 6 months ago
2006
The electrostatic discharge (ESD) robustness of different thin-film devices, including three diodes and two thin-film transistors (TFTs) in low-temperature polysilicon (LTPS) tech...
148
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HPDC
2003
IEEE
15 years 11 months ago
2003
IEEE
Divisible workload applications arise in many fields of science and engineering. They can be parallelized in master-worker fashion and relevant scheduling strategies have been pr...
165
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ICCAD
2009
IEEE
15 years 4 months ago
2009
IEEE
Very thorough online self-test is essential for overcoming major reliability challenges such as early-life failures and transistor aging in advanced technologies. This paper demon...
143
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CDC
2009
IEEE
15 years 11 months ago
2009
IEEE
— This paper is based on a comprehensive dynamic mathematical model (Copernicus) of vascular bubble formation and growth during and after decompression from a dive. The model des...
170
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ICCV
2007
IEEE
16 years 8 months ago
2007
IEEE
In this paper we propose a general framework to solve the articulated shape matching problem, formulated as finding point-to-point correspondences between two shapes represented b...