Extreme technology integration in the sub-micron regime comes with a rapid rise in heat dissipation and power density for modern processors. Dynamic voltage scaling is a widely us...
Amin Ansari, Shuguang Feng, Shantanu Gupta, Scott ...
As the d esig n-m anu factu ring interface becom es increasing ly com plicated with IC technolog y scaling , the correspond ing process variability poses g reat challeng es for na...
Yang Xu, Kan-Lin Hsiung, Xin Li, Ivan Nausieda, St...
While circuit density and power efficiency increase with each major advance in IC technology, reliability with respect to soft errors tends to decrease. Current solutions to this...
Smita Krishnaswamy, Stephen Plaza, Igor L. Markov,...
—Spatial multiplexing for millimeter (mm) wave line of sight (LOS) links potentially enables data rates of the order of 10-100 Gbps. Most prior work in this area has focused on u...
Eric Torkildson, Colin Sheldon, Upamanyu Madhow, M...