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ICEIS
2000
IEEE
15 years 12 months ago
Date Warehouse Design
Stefano Rizzi, Matteo Golfarelli
ICCV
2003
IEEE
16 years 9 months ago
Two-Frame Wide Baseline Matching
This paper describes a novel approach to automatically recover corresponding feature points and epipolar geometry over two wide baseline frames. Our contributions consist of sever...
Jiangjian Xiao, Mubarak Shah