Local invariant feature based methods have been proven to be effective in computer vision for object recognition and learning. But for an image, the number of points detected and ...
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...
We propose a visualization approach for large dynamic graph structures with high degree variation and low diameter. In particular, we reduce visual complexity by multiple modes of ...
The behavior of some stochastic chemical reaction networks is largely unaffected by slight inaccuracies in reaction rates. We formalize the robustness of state probabilities to re...
The availability of large-scale computing platforms comprised of tens of thousands of multicore processors motivates the need for the next generation of highly scalable sparse line...