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ICML
2006
IEEE
16 years 7 months ago
Statistical debugging: simultaneous identification of multiple bugs
We describe a statistical approach to software debugging in the presence of multiple bugs. Due to sparse sampling issues and complex interaction between program predicates, many g...
Alice X. Zheng, Michael I. Jordan, Ben Liblit, May...
ICML
2005
IEEE
16 years 7 months ago
Optimizing abstaining classifiers using ROC analysis
Classifiers that refrain from classification in certain cases can significantly reduce the misclassification cost. However, the parameters for such abstaining classifiers are ofte...
Tadeusz Pietraszek
ICML
2005
IEEE
16 years 7 months ago
Implicit surface modelling as an eigenvalue problem
We discuss the problem of fitting an implicit shape model to a set of points sampled from a co-dimension one manifold of arbitrary topology. The method solves a non-convex optimis...
Christian Walder, Olivier Chapelle, Bernhard Sch&o...
ICML
2003
IEEE
16 years 7 months ago
Kernel PLS-SVC for Linear and Nonlinear Classification
A new method for classification is proposed. This is based on kernel orthonormalized partial least squares (PLS) dimensionality reduction of the original data space followed by a ...
Roman Rosipal, Leonard J. Trejo, Bryan Matthews
ICML
2002
IEEE
16 years 7 months ago
Interpreting and Extending Classical Agglomerative Clustering Algorithms using a Model-Based approach
We present two results which arise from a model-based approach to hierarchical agglomerative clustering. First, we show formally that the common heuristic agglomerative clustering...
Sepandar D. Kamvar, Dan Klein, Christopher D. Mann...