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KDD
2000
ACM
211views Data Mining» more  KDD 2000»
15 years 9 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
CVPR
2005
IEEE
16 years 8 months ago
Online Detection and Classification of Moving Objects Using Progressively Improving Detectors
Boosting based detection methods have successfully been used for robust detection of faces and pedestrians. However, a very large amount of labeled examples are required for train...
Omar Javed, Saad Ali, Mubarak Shah
ICIP
2008
IEEE
16 years 7 months ago
Managing privacy data in pervasive camera networks
Privacy protection of visual information is increasingly important as pervasive camera networks becomes more prevalent. The proposed scheme addresses the problem of preserving and...
Sen-Ching S. Cheung, Jithendra K. Paruchuri, Thinh...
ICPR
2004
IEEE
16 years 7 months ago
Eye Tracking Using Markov Models
We propose an eye detection and tracking method based on color and geometrical features of the human face using a monocular camera. In this method a decision is made on whether th...
A. M. Bagci, Ashfaq A. Khokhar, E. Cetin, Rashid A...
ICML
2002
IEEE
16 years 6 months ago
Pruning Improves Heuristic Search for Cost-Sensitive Learning
This paper addresses cost-sensitive classification in the setting where there are costs for measuring each attribute as well as costs for misclassification errors. We show how to ...
Valentina Bayer Zubek, Thomas G. Dietterich