Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
This paper presents a novel method for designing compact yet efficient hardware implementations of the Tate pairing over supersingular curves in small characteristic. Since such cu...
Abstract— This paper presents a framework for verifying compilation tools for parametrised hardware libraries with placement information. Such libraries are captured in Pebble, a...
Abstract. Recently, the authors described a training method for a convolutional neural network of threshold neurons. Hidden layers are trained by by clustering, in a feed-forward m...
Johannes Fieres, Karlheinz Meier, Johannes Schemme...