— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a major reliability concern in present-day digital circuit design. Further, with the recent usage of...
Sanjay V. Kumar, Chris H. Kim, Sachin S. Sapatneka...
This paper presents a method with an evolutionary approach to some of the tasks of integrated-circuit (IC) design. The work is focused on application-specific integrated circuits ...
We investigate techniques to design 45nm minimum-energy subthreshold CMOS circuits under timing constraints, considering the practical case of an 8-bit multiplier. We first show ...
Components-based development is promising in improving software development productivity and software quality by re-using existing well-tested software components. However, one of...