2778 search results - page 460 / 556 » Reuse Technique in Hardware Design |
162
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DAC
2007
ACM
16 years 7 months ago
2007
ACM
The ability to account for the growing impacts of multiple process variations in modern technologies is becoming an integral part of nanometer VLSI design. Under the context of ti...
412
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DAC
2012
ACM
13 years 8 months ago
2012
ACM
Due to the breakdown of Dennardian scaling, the percentage of a silicon chip that can switch at full frequency is dropping exponentially with each process generation. This utiliza...
184
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ASPDAC
2006
ACM
16 years 10 days ago
2006
ACM
- One of the critical issues in MTCMOS design is how to estimate a circuit delay quickly. In this paper, we propose a delay modeling and static timing analysis (STA) methodology ta...
156
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ISCA
2007
IEEE
16 years 20 days ago
2007
IEEE
Transient faults due to particle strikes are a key challenge in microprocessor design. Driven by exponentially increasing transistor counts, per-chip faults are a growing burden. ...
164
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IEEEPACT
2006
IEEE
16 years 12 days ago
2006
IEEE
The address sequence on the processor-memory bus can reveal abundant information about the control flow of a program. This can lead to critical information leakage such as encryp...