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DATE
2005
IEEE
115views Hardware» more  DATE 2005»
16 years 14 days ago
Functional Coverage Driven Test Generation for Validation of Pipelined Processors
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
Prabhat Mishra, Nikil D. Dutt
ISQED
2005
IEEE
106views Hardware» more  ISQED 2005»
16 years 13 days ago
Thermal-Aware Floorplanning Using Genetic Algorithms
In this work, we present a genetic algorithm based thermal-aware floorplanning framework that aims at reducing hot spots and distributing temperature evenly across a chip while op...
Wei-Lun Hung, Yuan Xie, Narayanan Vijaykrishnan, C...
ISCA
2003
IEEE
144views Hardware» more  ISCA 2003»
16 years 4 days ago
Half-Price Architecture
Current-generation microprocessors are designed to process instructions with one and two source operands at equal cost. Handling two source operands requires multiple ports for ea...
Ilhyun Kim, Mikko H. Lipasti
ITC
2003
IEEE
134views Hardware» more  ITC 2003»
16 years 4 days ago
Effectiveness Improvement of ECR Tests
Energy Consumption Ratio (ECR) test, a current-based test, has shown its ability to reduce the impact of process variations and detect hard-to-detect faults. The effectiveness of ...
Wanli Jiang, Erik Peterson, Bob Robotka
MICRO
2003
IEEE
148views Hardware» more  MICRO 2003»
16 years 4 days ago
Fast Secure Processor for Inhibiting Software Piracy and Tampering
Due to the widespread software piracy and virus attacks, significant efforts have been made to improve security for computer systems. For stand-alone computers, a key observation...
Jun Yang 0002, Youtao Zhang, Lan Gao