2778 search results - page 258 / 556 » Reuse Technique in Hardware Design |
180
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ISQED
2009
IEEE
16 years 1 months ago
2009
IEEE
The advance in semiconductor technologies presents the serious problem of parameter variations. They affect threshold voltage of transistors and thus circuit delay has variability...
161
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ICCD
2007
IEEE
16 years 26 days ago
2007
IEEE
Leakage power has grown significantly and is a major challenge in microprocessor design. Leakage is the dominant power component in second-level (L2) caches. This paper presents t...
172
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ICECCS
2000
IEEE
15 years 11 months ago
2000
IEEE
This research is part of a project to develop practical, effective, formalizable, automatable techniques for integration testing. Integration testing is an important part of the t...
201
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ICECCS
1996
IEEE
15 years 10 months ago
1996
IEEE
This research is part of a project to develop practical, effective, formalizable, automatable techniques for integration testing. Integration testing is an important part of the t...
188
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MTV
2003
IEEE
15 years 11 months ago
2003
IEEE
Bounded Model Checking (BMC) techniques have been used for formal hardware verification, with the help of tools such as GRASP (Generic search Algorithm for Satisfiability Proble...