This paper presents a method to automatically generate posynomial response surface models for the performance parameters of analog integrated circuits. The posynomial models enabl...
Walter Daems, Georges G. E. Gielen, Willy M. C. Sa...
NBTI (Negative Bias Temperature Instability) has emerged as the dominant PMOS device failure mechanism for sub100nm VLSI designs. There is little research to quantify its impact o...
Simulation of transaction level models (TLMs) is an established embedded systems design technique. Its use cases include virtual prototyping for early software development, platfo...
This paper proposes an energy efficient processor which can be used as a design alternative for the dynamic voltage scaling (DVS) processors in embedded system design. The proces...
Due to aggressive technology scaling, VLSI circuits are becoming increasingly susceptible to transient errors caused by single-event-upsets (SEUs). In this paper, we introduce two...