2778 search results - page 195 / 556 » Reuse Technique in Hardware Design |
184
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MICRO
2007
IEEE
16 years 22 days ago
2007
IEEE
Program runtime characteristics exhibit significant variation. As microprocessor architectures become more complex, their efficiency depends on the capability of adapting with wor...
176
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DATE
2005
IEEE
16 years 2 days ago
2005
IEEE
Technology Roadmap for Semiconductors (ITRS) clearly identifies the integration of electrochemical and electrobiological techniques as one of the system-level design challenges tha...
164
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ICCAD
1997
IEEE
15 years 10 months ago
1997
IEEE
Interconnect has become the dominating factor in determining circuit performance and reliability in deep submicron designs. In this embedded tutorial, we first discuss the trends...
180
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MICRO
2006
IEEE
16 years 14 days ago
2006
IEEE
Power delivery is a growing reliability concern in microprocessors as the industry moves toward feature-rich, powerhungrier designs. To battle the ever-aggravating power consumpti...
192
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DATE
2010
IEEE
15 years 11 months ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...