2778 search results - page 169 / 556 » Reuse Technique in Hardware Design |
183
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ICCD
1999
IEEE
15 years 10 months ago
1999
IEEE
This research explores any potential for an on-chip cache compression which can reduce not only cache miss ratio but also miss penalty, if main memory is also managed in compresse...
191
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FMSD
2002
15 years 6 months ago
2002
We present a new technique for verification of complex hardware devices that allows both generality andahighdegreeofautomation.Thetechniqueisbasedonournewwayofconstructinga"li...
264
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DSD
2011
IEEE
14 years 6 months ago
2011
IEEE
—With the opening up of white spaces, efficient use of the fragmented spectrum - TV white space in particular - has become an extremely important focus of research. Apart from ef...
166
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ICCAD
2007
IEEE
16 years 3 months ago
2007
IEEE
While circuit density and power efficiency increase with each major advance in IC technology, reliability with respect to soft errors tends to decrease. Current solutions to this...
201
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ISQED
2006
IEEE
16 years 12 days ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...