2778 search results - page 107 / 556 » Reuse Technique in Hardware Design |
155
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DAC
2005
ACM
16 years 7 months ago
2005
ACM
Device and interconnect fabrics at the nanoscale will have a density of defects and susceptibility to transient faults far exceeding those of current silicon technologies. In this...
164
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AICCSA
2006
IEEE
16 years 10 days ago
2006
IEEE
Poorly designed software systems are difficult to understand and maintain. Modifying code in one place could lead to unwanted repercussions elsewhere due to high coupling. Adding ...
183
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ICCD
2005
IEEE
16 years 3 months ago
2005
IEEE
: Power consumption in datapath modules due to redundant switching is an important design concern for high-performance applications. Operand isolation schemes are adopted to reduce...
182
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SAT
2009
Springer
16 years 24 days ago
2009
Springer
Probabilistic inference techniques can be used to estimate variable bias, or the proportion of solutions to a given SAT problem that fix a variable positively or negatively. Metho...
174
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ITC
2002
IEEE
15 years 11 months ago
2002
IEEE
1 Scan based transition tests are added to improve the detection of speed failures using scan tests. Empirical data suggests that both data volume and application time, for transi...