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ISQED
2007
IEEE
135views Hardware» more  ISQED 2007»
16 years 24 days ago
MARS-S: Modeling and Reduction of Soft Errors in Sequential Circuits
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we use...
Natasa Miskov-Zivanov, Diana Marculescu
FASE
2007
Springer
16 years 20 days ago
Redundancy Based Test-Suite Reduction
The size of a test-suite has a direct impact on the costs and the effort of software testing. Especially during regression testing, when software is re-tested after some modifica...
Gordon Fraser, Franz Wotawa
ICA
2007
Springer
16 years 20 days ago
Two Improved Sparse Decomposition Methods for Blind Source Separation
In underdetermined blind source separation problems, it is common practice to exploit the underlying sparsity of the sources for demixing. In this work, we propose two sparse decom...
B. Vikrham Gowreesunker, Ahmed H. Tewfik
OOPSLA
2007
Springer
16 years 19 days ago
Supporting systems QoS design and evolution through model transformations
We describe Quality of service pICKER (QUICKER), a model-driven QoS mapping toolchain for supporting the QoS design and evolution of systems software. QUICKER automates the mappin...
Amogh Kavimandan, Aniruddha S. Gokhale
ASAP
2006
IEEE
111views Hardware» more  ASAP 2006»
16 years 17 days ago
Fast Bit Compression and Expansion with Parallel Extract and Parallel Deposit Instructions
Current microprocessor instruction set architectures are word oriented, with some subword support. Many important applications, however, can realize substantial performance benefi...
Yedidya Hilewitz, Ruby B. Lee