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DAC
2002
ACM
16 years 7 months ago
Combined BEM/FEM substrate resistance modeling
For present-day micro-electronic designs, it is becoming ever more important to accurately model substrate coupling effects. Basically, either a Finite Element Method (FEM) or a B...
Eelco Schrik, N. P. van der Meijs
DAC
2004
ACM
16 years 7 months ago
Statistical optimization of leakage power considering process variations using dual-Vth and sizing
timing analysis tools to replace standard deterministic static timing analyzers whereas [8,27] develop approaches for the statistical estimation of leakage power considering within...
Ashish Srivastava, Dennis Sylvester, David Blaauw
DAC
2005
ACM
16 years 7 months ago
Flexible ASIC: shared masking for multiple media processors
ASIC provides more than an order of magnitude advantage in terms of density, speed, and power requirement per gate. However, economic (cost of masks) and technological (deep micro...
Jennifer L. Wong, Farinaz Koushanfar, Miodrag Potk...
SIGSOFT
2009
ACM
16 years 7 months ago
Supporting automatic model inconsistency fixing
Modern development environments often involve models with complex consistency relations. Some of the relations can be automatically established through "fixing procedures&quo...
Yingfei Xiong, Zhenjiang Hu, Haiyan Zhao, Hui Song...
SIGSOFT
2008
ACM
16 years 7 months ago
Javert: fully automatic mining of general temporal properties from dynamic traces
Program specifications are important for many tasks during software design, development, and maintenance. Among these, temporal specifications are particularly useful. They expres...
Mark Gabel, Zhendong Su
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