1022 search results - page 130 / 205 » Relators and Metric Bisimulations |
189
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IWPC
2010
IEEE
15 years 4 months ago
2010
IEEE
Abstract—Correcting software defects accounts for a significant amount of resources such as time, money and personnel. To be able to focus testing efforts where needed the most,...
168
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SIGSOFT
2010
ACM
15 years 4 months ago
2010
ACM
Empirical studies of software defects rely on links between bug databases and program code repositories. This linkage is typically based on bug-fixes identified in developer-enter...
213
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TCSV
2010
15 years 27 days ago
2010
Abstract--This paper proposes a no-reference quality assessment metric for digital video subject to H.264/AVC encoding. The proposed metric comprises two main steps: coding error e...
270
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Book
"Pattern recognition techniques are concerned with the theory and algorithms of putting abstract objects, e.g., measurements made on physical objects, into categories. Typical...
152
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CVPR
2004
IEEE
16 years 8 months ago
2004
IEEE
In this paper, we propose a face reconstruction technique that produces models that not only look good when texture mapped, but are also metrically accurate. Our method is designe...