Abstract. The shared-cache contention on Chip Multiprocessors causes performance degradation to applications and hurts system fairness. Many previously proposed solutions schedule ...
Statistical Static Timing Analysis has received wide attention recently and emerged as a viable technique for manufacturability analysis. To be useful, however, it is important th...
The electrostatic discharge (ESD) problem has become a challenging reliability issue in nanometer circuit design. High voltages resulted from ESD might cause high current densitie...
In deep submicron VLSI circuits, interconnect reliability due to electromigration and thermal effects is fast becoming a serious design issue particularly for long signal lines. T...
Based on multifractal analysis in wavelet pyramids of texture images, a new texture descriptor is proposed in this paper that implicitly combines information from both spatial and...