Because of their geometric complexity, high resolution 3D models, either designed in high-end modeling packages or acquired with range scanning devices, cannot be directly used in...
Julien Lacoste, Tamy Boubekeur, Bruno Jobard, Chri...
We present a novel method to estimate an approximation of the reflectance characteristics of optically thick, homogeneous translucent materials using only a single photograph as ...
The many levels of metal used in aggressive deep submicron process technologies has made fast and accurate capacitance extraction of complicated 3-D geometries of conductors essen...
Reconstruction algorithms for Optical Diffuse Tomography (ODT) rely heavily on fast and accurate forward models. Arbitrary geometries and boundary conditions need to be handled ri...
Jean-Charles Baritaux, S. Chandra Sekhar, Michael ...
Consider a projector-camera setup where a sinusoidal pattern is projected onto the scene, and an image of the objects imprinted with the pattern is captured by the camera. In this...
Daniel A. Vaquero, Matthew Turk, Ramesh Raskar, Ro...