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» Reflections on a Geometry of Processes
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GRAPHITE
2007
ACM
15 years 10 months ago
Appearance preserving octree-textures
Because of their geometric complexity, high resolution 3D models, either designed in high-end modeling packages or acquired with range scanning devices, cannot be directly used in...
Julien Lacoste, Tamy Boubekeur, Bruno Jobard, Chri...
CGF
2011
14 years 10 months ago
BSSRDF Estimation from Single Images
We present a novel method to estimate an approximation of the reflectance characteristics of optically thick, homogeneous translucent materials using only a single photograph as ...
Adolfo Muñoz, Jose I. Echevarria, Francisco...
DAC
1999
ACM
16 years 7 months ago
A Multiscale Method for Fast Capacitance Extraction
The many levels of metal used in aggressive deep submicron process technologies has made fast and accurate capacitance extraction of complicated 3-D geometries of conductors essen...
Johannes Tausch, Jacob K. White
ISBI
2008
IEEE
16 years 7 months ago
A spline-based forward model for Optical Diffuse Tomography
Reconstruction algorithms for Optical Diffuse Tomography (ODT) rely heavily on fast and accurate forward models. Arbitrary geometries and boundary conditions need to be handled ri...
Jean-Charles Baritaux, S. Chandra Sekhar, Michael ...
CVPR
2009
IEEE
16 years 3 months ago
A projector-camera setup for geometry-invariant frequency demultiplexing
Consider a projector-camera setup where a sinusoidal pattern is projected onto the scene, and an image of the objects imprinted with the pattern is captured by the camera. In this...
Daniel A. Vaquero, Matthew Turk, Ramesh Raskar, Ro...