6568 search results - page 228 / 1314 » Reducing the Complexity of Reductions |
156
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VLSID
2008
IEEE
16 years 7 months ago
2008
IEEE
Continuous technology scaling has resulted in an increase in both, the power density as well as the variation in device dimensions (process variations) of the manufactured process...
146
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HPCA
2005
IEEE
16 years 7 months ago
2005
IEEE
Due to increasing power densities, both on-chip average and peak temperatures are fast becoming a serious bottleneck in processor design. This is due to the cost of removing the h...
181
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HPCA
2005
IEEE
16 years 7 months ago
2005
IEEE
If current technology scaling trends hold, leakage power dissipation will soon become the dominant source of power consumption in high performance processors. Caches, due to the f...
173
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ICCD
2006
IEEE
16 years 3 months ago
2006
IEEE
— Accurate estimation of worst-case crosstalk effects is critical for a realistic estimation of the worst-case behavior of deep sub-micron circuits. Crosstalk analysis models usu...
164
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ICCD
2004
IEEE
16 years 3 months ago
2004
IEEE
Leakage current is a key factor in IC power consumption even in the active operating mode. We investigate the simultaneous optimization of gate size and threshold voltage to reduc...