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DATE
2007
IEEE
110views Hardware» more  DATE 2007»
16 years 1 months ago
Nonlinearity analysis of Analog/RF circuits using combined multisine and volterra analysis
Abstract— Modern integrated radio systems require highly linear analog/RF circuits. Two-tone simulations are commonly used to study a circuit’s nonlinear behavior. Very often, ...
Jonathan Borremans, Ludwig De Locht, Piet Wambacq,...
ECRTS
2007
IEEE
16 years 1 months ago
WCET-Directed Dynamic Scratchpad Memory Allocation of Data
Many embedded systems feature processors coupled with a small and fast scratchpad memory. To the difference with caches, allocation of data to scratchpad memory must be handled by...
Jean-François Deverge, Isabelle Puaut
ESCIENCE
2007
IEEE
16 years 1 months ago
Connecting Scientific Data to Scientific Experiments with Provenance
As scientific workflows and the data they operate on, grow in size and complexity, the task of defining how those workflows should execute (which resources to use, where the resou...
Simon Miles, Ewa Deelman, Paul T. Groth, Karan Vah...
ETS
2007
IEEE
94views Hardware» more  ETS 2007»
16 years 1 months ago
An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy
An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. Therefore embedded memories are commonly equipped with spare r...
Philipp Öhler, Sybille Hellebrand, Hans-Joach...
GLVLSI
2007
IEEE
189views VLSI» more  GLVLSI 2007»
16 years 1 months ago
Hardware-accelerated path-delay fault grading of functional test programs for processor-based systems
The path-delay fault simulation of functional tests on complex circuits such as current processor-based systems is a daunting task. The amount of computing power and memory needed...
Paolo Bernardi, Michelangelo Grosso, Matteo Sonza ...
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