3702 search results - page 432 / 741 » Reducing Misclassification Costs |
142
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
The electrostatic discharge (ESD) problem has become a challenging reliability issue in nanometer circuit design. High voltages resulted from ESD might cause high current densitie...
142
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ICCAD
2005
IEEE
16 years 3 months ago
2005
IEEE
— One of the critical goals in code optimization for MPSoC architectures is to minimize the number of off-chip memory accesses. This is because such accesses can be extremely cos...
150
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ICCAD
2005
IEEE
16 years 3 months ago
2005
IEEE
—Existing ASIPs (application-specific instruction-set processors) and compiler-based co-processor synthesis approaches meet the increasing performance requirements of embedded ap...
141
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ICCAD
2005
IEEE
16 years 3 months ago
2005
IEEE
— Increasingly prominent variational effects impose imminent threat to the progress of VLSI technology. This work explores redundancy, which is a well-known fault tolerance techn...
163
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SOSP
2009
ACM
16 years 3 months ago
2009
ACM
Faulty device drivers cause significant damage through down time and data loss. The problem can be mitigated by an improved driver development process that guarantees correctness...