3702 search results - page 287 / 741 » Reducing Misclassification Costs |
158
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DATE
2005
IEEE
16 years 7 days ago
2005
IEEE
Multi-site testing is a popular and effective way to increase test throughput and reduce test costs. We present a test throughput model, in which we focus on wafer testing, and co...
156
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DATE
2005
IEEE
16 years 7 days ago
2005
IEEE
Temperature affects not only the reliability but also the performance, power, and cost of the embedded system. This paper proposes a thermal-aware task allocation and scheduling a...
175
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DATE
2005
IEEE
16 years 7 days ago
2005
IEEE
Coarse-grained reconfigurable architectures aim to achieve both goals of high performance and flexibility. However, existing reconfigurable array architectures require many resour...
170
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FDL
2005
IEEE
16 years 7 days ago
2005
IEEE
Although Moore’s Law enables a huge number of components to be integrated into a single chip, design methods that will allow system architects to put the components together to ...
176
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HICSS
2005
IEEE
16 years 7 days ago
2005
IEEE
Data persistency is a fundamental, but complex aspect of a modern software development process. Therefore, in order to reduce development costs and improve a system’s quality, s...