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DFT
2006
IEEE
148views VLSI» more  DFT 2006»
15 years 8 months ago
Bilateral Testing of Nano-scale Fault-tolerant Circuits
As the technology enters the nano dimension, the inherent unreliability of nanoelectronics is making fault-tolerant architectures increasingly necessary in building nano systems. ...
Lei Fang, Michael S. Hsiao
GEOINFO
2007
15 years 8 months ago
Comparison of Machine Learning Algorithms for Mapping the Phytophysiognomies of the Brazilian Cerrado
This present work describes the classification of the Phytophysiognomies present in the Brazilian Cerrado biome through the means Artificial Intelligence; data from remote sensing ...
Luciano T. de Oliveira, Thomaz C. de A. Oliveira, ...
SIMUTOOLS
2008
15 years 8 months ago
Opportunistic networking in OMNeT++
This work describes mechanisms for simulating opportunistic and delay-tolerant networks in the OMNeT++ discrete event simulator. The mechanisms allow for simulating open systems o...
Ólafur Ragnar Helgason, Kristján Val...
ECIS
2004
15 years 8 months ago
IS Process Innovation Unlearning in Organisations
This paper identifies mechanisms that affected over 200 Information System Process Innovation (ISPI) unlearning decisions in three organisational environments over a period that s...
Erja Mustonen-Ollila
IJCAI
2001
15 years 7 months ago
Integrating Expectations from Different Sources to Help End Users Acquire Procedural Knowledge
Role-limiting approaches using explicit theories of problem-solving have been successful for acquiring knowledge from domain experts1 . However most systems using this approach do...
Jim Blythe