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KDD
2000
ACM
211views Data Mining» more  KDD 2000»
15 years 10 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
ISCA
2007
IEEE
217views Hardware» more  ISCA 2007»
15 years 6 months ago
Parallel Processing of High-Dimensional Remote Sensing Images Using Cluster Computer Architectures
Hyperspectral sensors represent the most advanced instruments currently available for remote sensing of the Earth. The high spatial and spectral resolution of the images supplied ...
David Valencia, Antonio Plaza, Pablo Martín...
JCST
2010
119views more  JCST 2010»
15 years 5 months ago
Location, Localization, and Localizability
Abstract Location-aware technology spawns numerous unforeseen pervasive applications in a wide range of living, production, commence, and public services. This article provides an ...
Yunhao Liu, Zheng Yang, Xiaoping Wang, Lirong Jian
CVPR
2009
IEEE
17 years 2 months ago
HOP: Hierarchical Object Parsing
In this paper we consider the problem of object parsing, namely detecting an object and its components by composing them from image observations. Apart from object localization, ...
Iasonas Kokkinos, Alan L. Yuille
ICIP
2002
IEEE
16 years 8 months ago
Smart cameras with real-time video object generation
This paper presents a system for video object generation and selective encoding with applications in surveillance, mobile videophones, and automotive industry. Object tracking and...
Alessio Del Bue, Dorin Comaniciu, Visvanathan Rame...