2215 search results - page 297 / 443 » Rationality and Digital Technology |
203
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ISQED
2006
IEEE
16 years 17 days ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...
161
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3DGIS
2006
Springer
16 years 16 days ago
2006
Springer
Abstract Three-dimensional (3D) building model is one of the most important components in a cyber city implementation and application. This study developed an effective and highly ...
170
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ASPDAC
2006
ACM
16 years 15 days ago
2006
ACM
As technology scales down, timing verification of digital integrated circuits becomes an increasingly challenging task due to the gate and wire variability. Therefore, statistical...
153
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ASSETS
2006
ACM
16 years 15 days ago
2006
ACM
Visual content in lectures can be enhanced for use by students with visual disabilities by using high-resolution digital still cameras. This paper presents a system which uses two...
133
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DAC
2006
ACM
16 years 15 days ago
2006
ACM
With the advent of carbon nanotube technology, evaluating circuit and system performance using these devices is becoming extremely important. In this paper, we propose a quasi-ana...