1511 search results - page 173 / 303 » Randomness, lowness and degrees |
141
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DATE
2003
IEEE
15 years 11 months ago
2003
IEEE
In Networks on Chip, NoC, very low cost and high performance switches will be of critical importance. For a regular two-dimensional NoC we propose a very simple, memoryless switch...
169
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DFT
2003
IEEE
15 years 11 months ago
2003
IEEE
Transient faults in VLSI circuits could lead to disastrous consequences. With technology scaling, circuits are becoming increasingly vulnerable to transient faults. This papers pr...
131
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ITC
1999
IEEE
15 years 10 months ago
1999
IEEE
Power consumption of digital systems may increase significantly during testing. In this paper, systems equipped with a scan-based built-in self-test like the STUMPS architecture a...
154
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ICCAD
1996
IEEE
15 years 10 months ago
1996
IEEE
A scan-based BIST scheme is presented which guarantees complete fault coverage with very low hardware overhead. A probabilistic analysis shows that the output of an LFSR which fee...
184
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AINA
2004
IEEE
15 years 10 months ago
2004
IEEE
Prior survey of RED algorithm deployment on multiqueue system with shared buffer was unfair and sensitive to congestion level by statically setting the parameters. In this paper, ...