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DAC
2008
ACM
16 years 7 months ago
Modeling of failure probability and statistical design of spin-torque transfer magnetic random access memory (STT MRAM) array fo
: Spin-Torque Transfer Magnetic RAM (STT MRAM) is a promising candidate for future universal memory. It combines the desirable attributes of current memory technologies such as SRA...
Jing Li, Charles Augustine, Sayeef S. Salahuddin, ...
DATE
2008
IEEE
204views Hardware» more  DATE 2008»
16 years 1 months ago
Deep Submicron Interconnect Timing Model with Quadratic Random Variable Analysis
Shrinking feature sizes and process variations are of increasing concern in modern technology. It is urgent that we develop statistical interconnect timing models which are harmon...
Jun-Kuei Zeng, Chung-Ping Chen
VLSID
2005
IEEE
120views VLSI» more  VLSID 2005»
16 years 12 days ago
On Finding Consecutive Test Vectors in a Random Sequence for Energy-Aware BIST Design
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
Sheng Zhang, Sharad C. Seth, Bhargab B. Bhattachar...
CHES
2005
Springer
149views Cryptology» more  CHES 2005»
16 years 11 days ago
Resistance of Randomized Projective Coordinates Against Power Analysis
Embedded devices implementing cryptographic services are the result of a trade-off between cost, performance and security. Aside from flaws in the protocols and the algorithms us...
William Dupuy, Sébastien Kunz-Jacques
COCO
2003
Springer
145views Algorithms» more  COCO 2003»
16 years 1 days ago
Hardness vs. Randomness within Alternating Time
We study the complexity of building pseudorandom generators (PRGs) with logarithmic seed length from hard functions. We show that, starting from a function f : {0, 1}l → {0, 1} ...
Emanuele Viola