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ALT
2000
Springer
16 years 3 months ago
On the Noise Model of Support Vector Machines Regression
Abstract. Support Vector Machines Regression (SVMR) is a learning technique where the goodness of fit is measured not by the usual quadratic loss function (the mean square error),...
Massimiliano Pontil, Sayan Mukherjee, Federico Gir...
ICCD
2008
IEEE
111views Hardware» more  ICCD 2008»
16 years 3 months ago
Test-access mechanism optimization for core-based three-dimensional SOCs
— Test-access mechanisms (TAMs) and test wrappers (e.g., the IEEE Standard 1500 wrapper) facilitate the modular testing of embedded cores in a core-based system-on-chip (SOC). Su...
Xiaoxia Wu, Yibo Chen, Krishnendu Chakrabarty, Yua...
ICCAD
2008
IEEE
138views Hardware» more  ICCAD 2008»
16 years 3 months ago
Fault tolerant placement and defect reconfiguration for nano-FPGAs
—When manufacturing nano-devices, defects are a certainty and reliability becomes a critical issue. Until now, the most pervasive methods used to address reliability, involve inj...
Amit Agarwal, Jason Cong, Brian Tagiku
ICCAD
2003
IEEE
127views Hardware» more  ICCAD 2003»
16 years 3 months ago
A Probabilistic-Based Design Methodology for Nanoscale Computation
As current silicon-based techniques fast approach their practical limits, the investigation of nanoscale electronics, devices and system architectures becomes a central research p...
R. Iris Bahar, Joseph L. Mundy, Jie Chen
CVPR
2010
IEEE
16 years 2 months ago
3D Shape Scanning with a Time-of-Flight Camera
We describe a method for 3D object scanning by aligning depth scans that were taken from around an object with a time-of-flight camera. These ToF cameras can measure depth scans ...
Christian Theobalt, Yan Cui, Sebastian Schuon, Seb...