Increasing effects of fabrication variability have inspired a growing interest in statistical techniques for design optimization. In this work, we propose a Monte-Carlo driven sto...
—Verification is a major issue in circuit and system design. Formal methods like bounded model checking (BMC) can guarantee a high quality of the verification. There are severa...
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
We describe a technique for video summarization that uses motion descriptors computed in the compressed domain to speed up conventional color based video summarization technique. ...
We study the multicast capacity of a random wireless network consisting of ordinary wireless nodes and base stations, known as a hybrid network. Assume that n ordinary wireless no...