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ICCAD
2007
IEEE
96views Hardware» more  ICCAD 2007»
16 years 4 months ago
Monte-Carlo driven stochastic optimization framework for handling fabrication variability
Increasing effects of fabrication variability have inspired a growing interest in statistical techniques for design optimization. In this work, we propose a Monte-Carlo driven sto...
Vishal Khandelwal, Ankur Srivastava
DATE
2009
IEEE
90views Hardware» more  DATE 2009»
16 years 1 months ago
Property analysis and design understanding
—Verification is a major issue in circuit and system design. Formal methods like bounded model checking (BMC) can guarantee a high quality of the verification. There are severa...
Ulrich Kühne, Daniel Große, Rolf Drechs...
182
Voted
VTS
2008
IEEE
77views Hardware» more  VTS 2008»
16 years 1 months ago
Test-Pattern Ordering for Wafer-Level Test-During-Burn-In
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
Sudarshan Bahukudumbi, Krishnendu Chakrabarty
SPIESR
2001
105views Database» more  SPIESR 2001»
15 years 8 months ago
Video summarization using motion descriptors
We describe a technique for video summarization that uses motion descriptors computed in the compressed domain to speed up conventional color based video summarization technique. ...
Ajay Divakaran, Kadir A. Peker, Huifang Sun
MOBIHOC
2008
ACM
16 years 6 months ago
Multicast capacity for hybrid wireless networks
We study the multicast capacity of a random wireless network consisting of ordinary wireless nodes and base stations, known as a hybrid network. Assume that n ordinary wireless no...
XuFei Mao, Xiang-Yang Li, ShaoJie Tang