9218 search results - page 1720 / 1844 » RFID Technology and Applications |
163
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EUROSYS
2009
ACM
16 years 3 months ago
2009
ACM
Device drivers are notorious for being a major source of failure in operating systems. In analysing a sample of real defects in Linux drivers, we found that a large proportion (39...
164
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ICCD
2008
IEEE
16 years 3 months ago
2008
IEEE
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
145
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ICCD
2005
IEEE
16 years 3 months ago
2005
IEEE
Abstract— Noise induced by impedance discontinuities from VLSI packaging is one of the leading challenges facing system level designers in the next decade. The performance of IC ...
179
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
Enumeration of bounded size cuts is an important step in several logic synthesis algorithms such as technology mapping and re-writing. The standard algorithm does not scale beyond...
154
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
Temperature monitoring using thermal sensors is an essential tool for evaluating the thermal behavior and sustaining the reliable operation in high-performance and high-power syst...