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DAC
2007
ACM
16 years 7 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
DAC
2003
ACM
16 years 7 months ago
A cost-driven lithographic correction methodology based on off-the-shelf sizing tools
As minimum feature sizes continue to shrink, patterned features have become significantly smaller than the wavelength of light used in optical lithography. As a result, the requir...
Puneet Gupta, Andrew B. Kahng, Dennis Sylvester, J...
DAC
2005
ACM
16 years 7 months ago
Hardware speech recognition for user interfaces in low cost, low power devices
We propose a system architecture for real-time hardware speech recognition on low-cost, power-constrained devices. The system is intended to support real-time speech-based user in...
Sergiu Nedevschi, Rabin K. Patra, Eric A. Brewer
WWW
2009
ACM
16 years 7 months ago
Automatically assessing resource quality for educational digital libraries
With the rise of community-generated web content, the need for automatic assessment of resource quality has grown, particularly in the realm of educational digital libraries. We d...
Philipp G. Wetzler, Steven Bethard, Kirsten R. But...
WWW
2009
ACM
16 years 7 months ago
Analyzing seller practices in a Brazilian marketplace
E-commerce is growing at an exponential rate. In the last decade, there has been an explosion of online commercial activity enabled by World Wide Web (WWW). These days, many consu...
Adriano M. Pereira, Diego Duarte, Paulo Góe...
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