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CODES
2007
IEEE
16 years 1 months ago
2007
IEEE
Early embedded SW development with transaction-level models has been broadly promoted to improve SoC design productivity. But the proposed APIs only provide low-level read/write o...
200
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DATE
2007
IEEE
16 years 1 months ago
2007
IEEE
In deep submicron circuits, elevation in temperatures has brought new challenges in reliability, timing, performance, cooling costs and leakage power. Conventional thermal managem...
214
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DATE
2007
IEEE
16 years 1 months ago
2007
IEEE
We present a methodology for generating optimized architectures for data bandwidth constrained extensible processors. We describe a scalable Integer Linear Programming (ILP) formu...
170
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DATE
2007
IEEE
16 years 1 months ago
2007
IEEE
Extreme transistor scaling trends in silicon technology are soon to reach a point where manufactured systems will suffer from limited device reliability and severely reduced life...
180
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DDECS
2007
IEEE
16 years 1 months ago
2007
IEEE
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...