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ITC
1998
IEEE
59views Hardware» more  ITC 1998»
15 years 11 months ago
Stimulus generation for built-in self-test of charge-pump phase-locked loops
Abstract - This paper addresses the issue of the stimulation of charge-pump phase-locked loops for built-in selftest applications. It is shown that three nodes of the PLL qualify f...
Benoît R. Veillette, Gordon W. Roberts
ISSS
1997
IEEE
142views Hardware» more  ISSS 1997»
15 years 11 months ago
Optimization Method for Broadband Modem FIR Filter Design using Common Subexpression Elimination
- An approach for broadband modem FIR filter design optimization is presented. It addresses the minimization of the number of addersubtractors used in the hardware implementation o...
Robert Pasko, Patrick Schaumont, Veerle Derudder, ...
177
Voted
VTS
1997
IEEE
86views Hardware» more  VTS 1997»
15 years 11 months ago
Methods to reduce test application time for accumulator-based self-test
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
Albrecht P. Stroele, Frank Mayer
ITC
1996
IEEE
98views Hardware» more  ITC 1996»
15 years 11 months ago
Mixed-Mode BIST Using Embedded Processors
Abstract. In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not comp...
Sybille Hellebrand, Hans-Joachim Wunderlich, Andre...
ICCAD
1994
IEEE
127views Hardware» more  ICCAD 1994»
15 years 11 months ago
Synthesis of concurrent system interface modules with automatic protocol conversion generation
-- We describe a new high-level compiler called Integral fordesigning system interface modules. The inputis a high-levelconcurrent algorithmic specification that can model complex ...
Bill Lin, Steven Vercauteren