We describe questions that commonly arise in early-phase user research for new technology products concerning customer needs, priorities, and market definition. We suggest that me...
Christopher N. Chapman, Edwin Love, James L. Alfor...
In the online world every person has to hold a number of different data sets so as to be able to have access to various e-services and take part in specific economical and social ...
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...
Sanjay V. Kumar, Chris H. Kim, Sachin S. Sapatneka...
This paper is concerned with statically analyzing the susceptibility of arbitrary combinational circuits to single event upsets that are becoming a significant concern for reliabi...
In High Volume Manufacturing (HVM), system control is shared between automation and human workers. The social organisation of workers plays an important role in supporting human d...