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DAC
2000
ACM
16 years 7 months ago
High-level simulation of substrate noise generation including power supply noise coupling
Substrate noise caused by large digital circuits will degrade the performance of analog circuits located on the same substrate. To simulate this performance degradation, the total...
Marc van Heijningen, Mustafa Badaroglu, Sté...
VLSID
2009
IEEE
115views VLSI» more  VLSID 2009»
16 years 7 months ago
Efficient Techniques for Directed Test Generation Using Incremental Satisfiability
Functional validation is a major bottleneck in the current SOC design methodology. While specification-based validation techniques have proposed several promising ideas, the time ...
Prabhat Mishra, Mingsong Chen
ICCAD
2006
IEEE
130views Hardware» more  ICCAD 2006»
16 years 3 months ago
On bounding the delay of a critical path
Process variations cause different behavior of timingdependent effects across different chips. In this work, we analyze one example of timing-dependent effects, crosscoupling ...
Leonard Lee, Li-C. Wang
ATAL
2003
Springer
15 years 12 months ago
Modelling secure multiagent systems
Security plays an important role in the development of multiagent systems. However, a careful analysis of software development processes shows that the definition of security requ...
Haralambos Mouratidis, Paolo Giorgini, Gordon A. M...
DATE
1999
IEEE
147views Hardware» more  DATE 1999»
15 years 11 months ago
Efficient BIST Hardware Insertion with Low Test Application Time for Synthesized Data Paths
In this paper, new and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data paths obtained from high level synthesis. The methodology is ba...
Nicola Nicolici, Bashir M. Al-Hashimi