3639 search results - page 372 / 728 » Provenance as Dependency Analysis |
164
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ICDAR
2003
IEEE
16 years 2 days ago
2003
IEEE
In this paper, we propose a Bayesian network framework for explicitly modeling components and their relationships of Korean Hangul characters. A Hangul character is modeled with h...
185
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DIAGRAMS
2000
Springer
15 years 11 months ago
2000
Springer
Bar charts are common data representations in scientific and technical papers. In order to recognize the printed bar charst, we present a new Hough based bar chart recognition algo...
176
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ASPDAC
1999
ACM
15 years 11 months ago
1999
ACM
Certain manufacturing steps in very deep submicron VLSI involve chemical-mechanical polishing CMP which has varying e ects on device and interconnect features, depending on loca...
179
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IPPS
1999
IEEE
15 years 11 months ago
1999
IEEE
This paper presents the Pure/Epos approach to deal with the high complexity of adaptable operating systems and also to diminish the distance between application and operating syste...
190
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SMI
1999
IEEE
15 years 11 months ago
1999
IEEE
Inspection of reflection line patterns is a standard way to check the quality of free form surfaces. In this paper, we describe an approach which enables the designer to control d...