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ET
2002
122views more  ET 2002»
15 years 6 months ago
Using At-Speed BIST to Test LVDS Serializer/Deserializer Function
LVDS is the acronym for Low-Voltage-DifferentialSignaling and is described in both the ANSI/TIA/EIA644 and IEEE 1596.3 standards. High performance yet Low Power and EMI have made ...
Magnus Eckersand, Fredrik Franzon, Ken Filliter
SQJ
2002
110views more  SQJ 2002»
15 years 6 months ago
A General Model of Unit Testing Efficacy
Much of software engineering is targeted towards identifying and removing existing defects while preventing the injection of new ones. Defect management is therefore one important ...
Houman Younessi, Panlop Zeephongsekul, Winai Bodhi...
COGSCI
2008
90views more  COGSCI 2008»
15 years 6 months ago
Using fMRI to Test Models of Complex Cognition
This article investigates the potential of fMRI to test assumptions about different components in models of complex cognitive tasks. If the components of a model can be associated...
John R. Anderson, Cameron S. Carter, Jon M. Fincha...
TR
2010
159views Hardware» more  TR 2010»
15 years 1 months ago
Accelerated Degradation Tests Applied to Software Aging Experiments
Abstract--In the past ten years, the software aging phenomenon has been systematically researched, and recognized by both academic, and industry communities as an important obstacl...
Rivalino Matias, Pedro Alberto Barbetta, Kishor S....
CCS
2007
ACM
16 years 1 months ago
Implementing and testing dynamic timeout adjustment as a dos counter-measure
In this paper we experimentally analyse various dynamic timeout adjustment strategies in server queues as potential counter-measures against degradation of service attacks. Previo...
Daniel Boteanu, Edouard Reich, José M. Fern...