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SEW
2007
IEEE
16 years 1 months ago
Testing Patterns
: After over a decade of use, design patterns continue to find new areas of application. In previous work, we presented a contract formalism for specifying patterns precisely, and...
Neelam Soundarajan, Jason O. Hallstrom, Adem Delib...
STACS
2007
Springer
16 years 28 days ago
Testing Convexity Properties of Tree Colorings
A coloring of a graph is convex if it induces a partition of the vertices into connected subgraphs. Besides being an interesting property from a theoretical point of view, tests f...
Eldar Fischer, Orly Yahalom
ATS
1998
IEEE
170views Hardware» more  ATS 1998»
15 years 11 months ago
A Ring Architecture Strategy for BIST Test Pattern Generation
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
Christophe Fagot, Olivier Gascuel, Patrick Girard,...
CONSTRAINTS
2007
112views more  CONSTRAINTS 2007»
15 years 6 months ago
Maxx: Test Pattern Optimisation with Local Search Over an Extended Logic
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
Francisco Azevedo
SAC
2005
ACM
16 years 11 days ago
Learning decision trees from dynamic data streams
: This paper presents a system for induction of forest of functional trees from data streams able to detect concept drift. The Ultra Fast Forest of Trees (UFFT) is an incremental a...
João Gama, Pedro Medas, Pedro Pereira Rodri...