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VTS
2008
IEEE
136views Hardware» more  VTS 2008»
16 years 1 months ago
Test-Pattern Grading and Pattern Selection for Small-Delay Defects
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Te...
IMSCCS
2007
IEEE
16 years 1 months ago
Multi-dimensional Cluster Misclassification Test for Pathway Differential Analysis of Diabetes
Gene pathway can be defined as a group of genes that interact with each other to perform some biological processes. Along with the efforts to identify the individual genes that pl...
Lily R. Liang, Vinay Mandal, Yi Lu, Deepak Kumar
BPM
2005
Springer
113views Business» more  BPM 2005»
16 years 10 days ago
Conformance Testing: Measuring the Fit and Appropriateness of Event Logs and Process Models
Most information systems log events (e.g., transaction logs, audit trails) to audit and monitor the processes they support. At the same time, many of these processes have been expl...
Anne Rozinat, Wil M. P. van der Aalst
CIVR
2004
Springer
194views Image Analysis» more  CIVR 2004»
16 years 5 days ago
A Test-Bed for Region-Based Image Retrieval Using Multiple Segmentation Algorithms and the MPEG-7 eXperimentation Model: The Sch
The aim of the SCHEMA Network of Excellence is to bring together a critical mass of universities, research centers, industrial partners and end users, in order to design a referenc...
Vasileios Mezaris, Haralambos Doulaverakis, Raul M...
CLEF
2003
Springer
16 years 14 hour ago
Creating the DISEQuA Corpus: A Test Set for Multilingual Question Answering
This paper describes the procedure adopted by the three co-ordinators of the CLEF 2003 question answering track (ITC-irst, UNED and ILLC) to create the question set for the monoli...
Bernardo Magnini, Simone Romagnoli, Alessandro Val...