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ICSE
2009
IEEE-ACM
16 years 1 months ago
WISE: Automated test generation for worst-case complexity
Program analysis and automated test generation have primarily been used to find correctness bugs. We present complexity testing, a novel automated test generation technique to ...
Jacob Burnim, Sudeep Juvekar, Koushik Sen
FGR
2008
IEEE
299views Biometrics» more  FGR 2008»
16 years 1 months ago
Face recognition with occlusions in the training and testing sets
Partial occlusions in face images pose a great problem for most face recognition algorithms. Several solutions to this problem have been proposed over the years – ranging from d...
Hongjun Jia, Aleix M. Martínez
ISVLSI
2007
IEEE
181views VLSI» more  ISVLSI 2007»
16 years 1 months ago
Code-coverage Based Test Vector Generation for SystemC Designs
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...
Alair Dias Jr., Diógenes Cecilio da Silva J...
APSEC
2005
IEEE
16 years 11 days ago
An Integrated Solution for Testing and Analyzing Java Applications in an Industrial Setting
Testing a large-scale, real-life commercial software application is a very challenging task due to the constant changes in the software, the involvement of multiple programmers an...
W. Eric Wong, J. Jenny Li
FASE
2005
Springer
16 years 8 days ago
Coverage Criteria for Testing of Object Interactions in Sequence Diagrams
This work defines several control-flow coverage criteria for testing the interactions among a set of collaborating objects. The criteria are based on UML sequence diagrams that a...
Atanas Rountev, Scott Kagan, Jason Sawin