10715 search results - page 292 / 2143 » Proofs from Tests |
178
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DDECS
2009
IEEE
15 years 10 months ago
2009
IEEE
Although the Neighborhood Pattern Sensitive Fault (NPSF) model is recognized as a high quality fault model for memory arrays, the excessive test application time cost associated wi...
162
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DAC
2005
ACM
15 years 8 months ago
2005
ACM
In this paper we propose a test compaction method for path delay faults in a logic circuit. The method generates a compact set of two-pattern tests for faults on long paths select...
196
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ECAI
2010
Springer
15 years 7 months ago
2010
Springer
Answer-set programming (ASP) is a well-acknowledged paradigm for declarative problem solving, yet comparably little effort has been spent on the investigation of methods to support...
173
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ENTCS
2010
15 years 6 months ago
2010
Component based development allows to build software upon existing components and promises to improve software reuse and reduce costs. To gain reliability of a component based sys...
152
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ESE
2006
15 years 6 months ago
2006
This research addresses the problem of statically analyzing input command syntax as defined in interface and requirements specifications and then generating test cases for dynamic ...