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175
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FATES
2005
Springer
16 years 7 days ago
2005
Springer
The global testing problem studied in this paper is to seek a definite answer to whether a system of concurrent black-boxes has an observable behavior in a given finite (but cou...
208
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COMPSAC
1999
IEEE
15 years 11 months ago
1999
IEEE
Design patterns have been used in object-oriented frameworks such as the IBM San Francisco framework, Apple's Rhaspody, OpenStep, and WebObjects, and DIWB. However, few guide...
195
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DATE
1999
IEEE
15 years 11 months ago
1999
IEEE
In this paper, new and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data paths obtained from high level synthesis. The methodology is ba...
165
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ASWEC
2007
IEEE
15 years 10 months ago
2007
IEEE
Testers often represent systems under test in input parameter models. These contain parameters with associated values. Combinations of parameter values, with one value for each pa...
157
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ITC
1991
IEEE
15 years 10 months ago
1991
IEEE
In diagnosing a failed system, a smart technician would choose tests to be performed based on the context of the situation. Currently, test program sets do not fault-. isolate wit...