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COMPSAC
2002
IEEE
15 years 11 months ago
Temporal Modeling of Software Test Coverage
This paper presents a temporal model for the coverage achieved by software testing. The proposed model, which is applicable at any level of the testing hierarchy, can determine th...
Sahra Sedigh-Ali, Arif Ghafoor, Raymond A. Paul
DATE
2002
IEEE
89views Hardware» more  DATE 2002»
15 years 11 months ago
A Hierarchical Test Scheme for System-On-Chip Designs
System-on-chip (SOC) design methodology is becoming the trend in the IC industry. Integrating reusable cores from multiple sources is essential in SOC design, and different design...
Jin-Fu Li, Hsin-Jung Huang, Jeng-Bin Chen, Chih-Pi...
170
Voted
ISSRE
2002
IEEE
15 years 11 months ago
Test Reuse in the Spreadsheet Paradigm
Spreadsheet languages are widely used by a variety of end users to perform many important tasks. Despite their perceived simplicity, spreadsheets often contain faults. Furthermore...
Marc Fisher II, Dalai Jin, Gregg Rothermel, Margar...
DATE
2008
IEEE
66views Hardware» more  DATE 2008»
16 years 1 months ago
Optimal Margin Computation for At-Speed Test
— In the face of increased process variations, at-speed manufacturing test is necessary to detect subtle delay defects. This procedure necessarily tests chips at a slightly highe...
Jinjun Xiong, Vladimir Zolotov, Chandu Visweswaria...
185
Voted
QSIC
2005
IEEE
16 years 9 days ago
Towards a Metamorphic Testing Methodology for Service-Oriented Software Applications
Testing applications in service-oriented architecture (SOA) environments needs to deal with issues like the unknown communication partners until the service discovery, the impreci...
W. K. Chan, S. C. Cheung, Karl R. P. H. Leung